Chapter 19

S00–T88: Injury, Poisoning and Certain Other Consequences of External Causes

Injury, Poisoning and Certain Other Consequences of External Causes diagnostic classification updated for 2026.

Chapter Instructions

Excludes2(Not included here. Code separately if applicable.)
Use Additional Code
  • code to identify any retained foreign body, if applicable (Z18.-)
Internal Codes
  • T84.86XA|

    Thrombosis due to internal orthopedic prosthetic devices, implants and grafts, initial encounter

  • T84.86XD|

    Thrombosis due to internal orthopedic prosthetic devices, implants and grafts, subsequent encounter

  • T84.86XS|

    Thrombosis due to internal orthopedic prosthetic devices, implants and grafts, sequela

  • T84.89|

    Other specified complication of internal orthopedic prosthetic devices, implants and grafts

  • T84.89XA|

    Other specified complication of internal orthopedic prosthetic devices, implants and grafts, initial encounter

  • T84.89XD|

    Other specified complication of internal orthopedic prosthetic devices, implants and grafts, subsequent encounter

  • T84.89XS|

    Other specified complication of internal orthopedic prosthetic devices, implants and grafts, sequela

  • T84.9|

    Unspecified complication of internal orthopedic prosthetic device, implant and graft

  • T84.9XXA|

    Unspecified complication of internal orthopedic prosthetic device, implant and graft, initial encounter

  • T84.9XXD|

    Unspecified complication of internal orthopedic prosthetic device, implant and graft, subsequent encounter

  • T84.9XXS|

    Unspecified complication of internal orthopedic prosthetic device, implant and graft, sequela

  • T85|

    Complications of other internal prosthetic devices, implants and grafts

  • T85.0|

    Mechanical complication of ventricular intracranial (communicating) shunt

  • T85.01|

    Breakdown (mechanical) of ventricular intracranial (communicating) shunt

  • T85.01XA|

    Breakdown (mechanical) of ventricular intracranial (communicating) shunt, initial encounter

  • T85.01XD|

    Breakdown (mechanical) of ventricular intracranial (communicating) shunt, subsequent encounter

  • T85.01XS|

    Breakdown (mechanical) of ventricular intracranial (communicating) shunt, sequela

  • T85.02|

    Displacement of ventricular intracranial (communicating) shunt

  • T85.02XA|

    Displacement of ventricular intracranial (communicating) shunt, initial encounter

  • T85.02XD|

    Displacement of ventricular intracranial (communicating) shunt, subsequent encounter

  • T85.02XS|

    Displacement of ventricular intracranial (communicating) shunt, sequela

  • T85.03|

    Leakage of ventricular intracranial (communicating) shunt

  • T85.03XA|

    Leakage of ventricular intracranial (communicating) shunt, initial encounter

  • T85.03XD|

    Leakage of ventricular intracranial (communicating) shunt, subsequent encounter

  • T85.03XS|

    Leakage of ventricular intracranial (communicating) shunt, sequela

  • T85.09|

    Other mechanical complication of ventricular intracranial (communicating) shunt

  • T85.09XA|

    Other mechanical complication of ventricular intracranial (communicating) shunt, initial encounter

  • T85.09XD|

    Other mechanical complication of ventricular intracranial (communicating) shunt, subsequent encounter

  • T85.09XS|

    Other mechanical complication of ventricular intracranial (communicating) shunt, sequela

  • T85.1|

    Mechanical complication of implanted electronic stimulator of nervous system

  • T85.11|

    Breakdown (mechanical) of implanted electronic stimulator of nervous system

  • T85.110|

    Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead)

  • T85.110A|

    Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), initial encounter

  • T85.110D|

    Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), subsequent encounter

  • T85.110S|

    Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), sequela

  • T85.111|

    Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead)

  • T85.111A|

    Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), initial encounter

  • T85.111D|

    Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), subsequent encounter

  • T85.111S|

    Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), sequela

  • T85.112|

    Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead)

  • T85.112A|

    Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead), initial encounter

  • T85.112D|

    Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead), subsequent encounter

  • T85.112S|

    Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead), sequela

  • T85.113|

    Breakdown (mechanical) of implanted electronic neurostimulator, generator

  • T85.113A|

    Breakdown (mechanical) of implanted electronic neurostimulator, generator, initial encounter

  • T85.113D|

    Breakdown (mechanical) of implanted electronic neurostimulator, generator, subsequent encounter

  • T85.113S|

    Breakdown (mechanical) of implanted electronic neurostimulator, generator, sequela

  • T85.118|

    Breakdown (mechanical) of other implanted electronic stimulator of nervous system

  • T85.118A|

    Breakdown (mechanical) of other implanted electronic stimulator of nervous system, initial encounter

  • T85.118D|

    Breakdown (mechanical) of other implanted electronic stimulator of nervous system, subsequent encounter

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